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Screw dislocation in the two-phase isotropic thin film of an interfacial crack
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Screw dislocation in the two-phase isotropic thin film of an interfacial crack

C.L. Chang
Engineering Fracture Mechanics, Vol.36(6), pp.979-986
1990

Abstract

The screw dislocation in the two-phase isotropic thin film of an interfacial crack has been investigated. The stress field, stress intensity factors at the crack tip and for dislocation emission, crack extension force, strain energy and the image force on the dislocation are obtained and found to be related to the thickness and effective shear modulus. The effect of size on fracture is pronounced when the thickness is smaller than the distance between dislocation and crack tip by a factor of 1000. The effect of the second phase on fracture is pronounced when μ (2)(1) is in the range from 0.01 to 100. Newton's third law is proved to be valid for any thickness and shear modulus ratio. This result can be reduced to three special cases. © 1990.

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