摘要
We propose a simple model for the nucleation of random intercalates during the growth of high-temperature superconductor (HTSC) films by pulsed laser deposition (PLD). The model predicts a very particular spatial distribution of defects: a Markovian-like sequence of displacements along the growth direction (c axis), as well as a two-component in-plane correlation function, characteristic of self-organized intercalates. A model for x-ray diffraction (XRD) on such structures is also developed and accounts for both c -axis and in-plane anomalies observed in XRD experiments. The method presented in this work constitutes a useful characterization tool in the optimization of deposition parameters for the growth of HTSC films. © 2007 The American Physical Society.