Abstract
Interference fringes are generally found in the photoluminescence (PL) spectrum of heterostructures with large refractive index differences between layers and with a smooth interface. To eliminate the interference effects in an air/GaN/InGaN/GaN/Al 2 O 3 structure, the measured interference fringe wavelengths of the PL spectrum are used to deduce the frequency dependent interference function of the system. This interference function is then used to numerically remove interference fringes from the as-measured PL spectrum. This versatile semiempirical method allows the derivation of the true PL spectrum from the measured data, including angular dependent spectra, without complicated calculations or additional measurements. © 2014 American Vacuum Society.