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Silicon microlens structures fabricated by scanning probe gray-scale nanolithography
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Silicon microlens structures fabricated by scanning probe gray-scale nanolithography

C.-F. Chen, S.-D. Tzeng, H.-Y. ChenS. Gwo
Optics Letters, 卷.30(6), 頁.652
2005

摘要

Silicon microlens;scanning probe gray-scale;nanolithography

We report on the micromachining of silicon microlens structures by use of scanning-probe gray-scale anodic oxidation along with dry anisotropic etching. Convex, concave, and arbitrarily shaped silicon microlenses with diameters as small as 2μm2μm are demonstrated. We also confirm the high fidelity of pattern transfer between the probe-induced oxides and the etched silicon microlens structures. Besides the flexibility, the important features of scanning-probe gray-scale anodic oxidation are small pixel size and pitch (of the order of tens of nanometers), an unlimited number of gray-scale levels, and the possibility of creating arbitrarily designed microlens structures with exquisite precision and resolution. With this approach, refractive, diffractive, and hybrid microlens arrays can be developed to create innovative optical components.

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