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Simple and fast method to fabricate single-nanoparticle-terminated atomic force microscope tips
Journal article   Peer reviewed

Simple and fast method to fabricate single-nanoparticle-terminated atomic force microscope tips

Hui-Wen Cheng, Yuan-Chih Chang, Chi-Tsu Yuan, Song-Nien Tang, Chia-Seng Chang, Jau Tang, Fu-Rong Chen, Rong-Long Pan and Fan-Gang Tseng
Journal of Physical Chemistry C, Vol.117(25), pp.13239-13246
27/06/2013

Abstract

This paper introduces a simple, yet controllable scheme to pick up a single 13 nm Au nanoparticle (Au-NP) using the tip of an atomic force microscope (AFM) probe through the application of electrical biases between the tip and the Au-NP. Transmission electron microscope (TEM) images were acquired to verify that a single Au-NP was attached to the AFM probe. We postulate that the mechanism underlying the ability to manipulate individual Au-NPs at the apex of the AFM probe tip is Coulomb interaction induced by tip bias. The AFM tip with the attached Au-NP was then used to study the interaction between a single quantum dot (QD) and the Au-NP. The blinking behavior of single colloidal CdSe/ZnS core/shell QD was significantly suppressed with the approach of the 13 nm Au-NP attached to the AFM tip. c 2013 American Chemical Society.

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