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Single CuOx nanowire memristor: Forming-free resistive switching behavior
Journal article   Peer reviewed

Single CuOx nanowire memristor: Forming-free resistive switching behavior

Kai-De Liang, Chi-Hsin Huang, Chih-Chung Lai, Jian-Shiou Huang, Hung-Wei Tsai, Yi-Chung Wang, Yu-Chuan Shih, Mu-Tung Chang, Shen-Chuan Lo and Yu-Lun Chueh
ACS Applied Materials and Interfaces, Vol.6(19), pp.16537-16544
08/10/2014

Abstract

AAO membrane CuOx nanowire forming free memristor ReRAM resistive switching
CuO x nanowires were synthesized by a low-cost and large-scale electrochemical process with AAO membranes at room temperature and its resistive switching has been demonstrated. The switching characteristic exhibits forming-free and low electric-field switching operation due to coexistence of significant amount of defects and Cu nanocrystals in the partially oxidized nanowires. The detailed resistive switching characteristics of CuO x nanowire systems have been investigated and possible switching mechanisms are systematically proposed based on the microstructural and chemical analysis via transmission electron microscopy.

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