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Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films
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Strain-induced polarization rotation in epitaxial (001) BiFeO3 thin films

H.W. Jang, S.H. Baek, D. Ortiz, C.M. Folkman, R.R. Das, Y.H. Chu, P. Shafer, J.X. Zhang, S. Choudhury, V. Vaithyanathan, …
Physical Review Letters, 卷.101(10), 107602
09/2008

摘要

Physics and Astronomy (all)
Direct measurement of the remanent polarization of high quality (001)-oriented epitaxial BiFeO3 thin films shows a strong strain dependence, even larger than conventional (001)-oriented PbTiO3 films. Thermodynamic analysis reveals that a strain-induced polarization rotation mechanism is responsible for the large change in the out-of-plane polarization of (001) BiFeO3 with biaxial strain while the spontaneous polarization itself remains almost constant. © 2008 The American Physical Society.

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