Abstract
The structure and electric properties of BiFe O3 (BFO) BaPb O3 (BPO) and Pt/BFO/BPO capacitors with forming gas annealing (FGA) treatment were investigated. X-ray diffraction patterns indicated that the annealing did not affect the structure and phase of BFO films. A degraded electric property was obtained in FGA-treated Pt/BFO/BPO films. It can be attributed to the formation of reduction and incomplete reduction of Bi+3 of BFO. Retention and fatigue properties were obtained in FGA-treated BPO/BFO/BPO capacitors. The normalized Pr loss was 22.8% after applying a voltage above 2 Vc (coercive voltage) with 1011 cycles. The retention behavior within 30 000 s is governed by the logarithmic time dependence. © 2007 American Institute of Physics.