摘要
Polarized neutron and X-ray reflectivity methods have been used to study the permalloy epitaxial thin films on sapphire with Cr as a buffer layer. The reflectivity result indicates that the magnetic interface is smoother than the chemical interface. It is possible that the magnetic moment of the intrusive Ni or Fe atoms across the interface can be assimilated by the near-by Cr atoms or the other way around.