- 題名
- Superior FeFET Reliability and Memory Window by Hybrid Solid-Solution/Superlattice HfZrO x and Interface Engineering
- 創作者：
- Tsen-Hsiang Pan - National Tsing Hua UniversityYu-Cheng Lin - Department of Engineering and System Science, National Tsing Hua University, Hsinchu, TaiwanYung-Hsien Wu - National Tsing Hua University
- 學術資源類型
- 期刊文章
- 出版日期
- 02/2026
- 出版資訊
- IEEE electron device letters, 卷.47(2), 頁碼.289-292
- 語言
- 英語
期刊文章
Superior FeFET Reliability and Memory Window by Hybrid Solid-Solution/Superlattice HfZrO x and Interface Engineering
IEEE electron device letters, 卷.47(2), 頁碼.289-292
02/2026
指標
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