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Surface Sulfurization of Liner and Ruthenium Metallization to Reduce Interface Scattering for Low-Resistance Interconnect
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Surface Sulfurization of Liner and Ruthenium Metallization to Reduce Interface Scattering for Low-Resistance Interconnect

Yu-Lin Chen, Kai-Yuan Hsiao, Ming-Yen Lu, Pei Yuin Keng守一 張
Applied Surface Science, 卷.652, 頁碼.159318-159318
15/04/2024

摘要

Ruthenium Metallization;Interface Scattering;Low-Resistance Interconnect

相關連結

指標

1 檢視次數

詳細資料

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