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Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns
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Testing Iterative Logic Arrays for Sequential Faults with a Constant Number of Patterns

Chih-Yuang Su 和 Cheng-Wen Wu
IEEE Transactions on Computers, 卷.43(4), 頁碼.495-501
1994
DOI: https://doi.org/10.1109/12.278489

摘要

C-testability iterative logic array logic testing M sequential fault testing test pattern generation testability Computational Theory and Mathematics Hardware and Architecture Software Theoretical Computer Science Electrical and Electronic Engineering
We show that a constant number of test vectors are sufficient for fully testing a k-dimensional ILA for sequential faults if the cell function is bijective. We then present an efficient algorithm to obtain such a test sequence. By extending the concept of C-testability and M-testability to sequential faults, the constant-length test sequence can be obtained. A pipelined array multiplier is shown to be C-testable with only 53 test vectors for exhaustively testing the sequential faults. © 1994 IEEE

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