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The Applications of Cross-Sectional Transmission Electron Microscope Study of BF2+-Implanted (001)Si
Journal article

The Applications of Cross-Sectional Transmission Electron Microscope Study of BF2+-Implanted (001)Si

C.W. Nieh and L.J. Chen
Proceedings of the National Science Council : Part A, Physical Science and Engineering Proceedings of the National Science Council : Part A, Physical Science and Engineering
1986

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