Abstract
The Taguchi method is the conventional approach used in off-line quality control. However, most previous Taguchi method applications have dealt only with a single-response problem. The multi-response problem has received only limited attention. Proposes an effective procedure on the basis of the quality loss of each response so as to achieve the optimization on multi-response problems in the Taguchi method. The procedure is a universal approach which can simultaneously deal with continuous and discrete data. Evaluates a plasma-enhanced chemical vapour deposition (PECVD) process experiment and a case study, indicating that the proposed procedure yields a satisfactory result. © MCB UP Ltd.