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The (pX, X) experiment - A new approach for partial sensitivity enhancement in trace element analysis
期刊文章

The (pX, X) experiment - A new approach for partial sensitivity enhancement in trace element analysis

Tsang-Lang Lin, Chien-Shu LuoJen-Chang Chou
Nuclear Instruments and Methods, 卷.151(3), 頁碼.439-444
05/1978

摘要

Medicine (all)
The (pX, X) technique has been proved to be a reliable method in trace element analysis when a large amount of neighboring element is present. As a test measurement copper was adopted as X-ray producing target bombarded by 3 MeV protons. Liquid samples containing various amounts of nickel and cobalt were studied. For the unfiltered characteristic X-rays of Cu, the effectiveness in exciting Co and Ni is different when one considers the absorption edges and the incident photon energy. The use of a Ni-filter for the reduction of Cu K β X-rays results in a further enhancement of detection response for Co relative to Ni. The analysis of Co contained in nickel disc and nickel coin showed the possible application of the (pX, X) technique to distinguish Co in mixtures containing large amounts of nickel. Detection sensitivity and background problems related to this method are also discussed. © 1978.

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