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The parameter extraction including field-plate effect of 0.25 νm 12 v LDMOSFETs
Journal article   Peer reviewed

The parameter extraction including field-plate effect of 0.25 νm 12 v LDMOSFETs

Chih-Min Hu, Kuo-Hsuan Lo, Chung-Yu Hung, Chun-Hsueh Chu, Da-Chiang Chang, Jih-Hsin Liu, Jeng Gong and Chih-Fang Huang
Semiconductor Science and Technology, Vol.27(1), 015017
01/2012

Abstract

This paper presents the parameter extraction including the field-plate effect of a 0.25 νm 12 V lateral diffused metal-oxide-semiconductor field effect transistor (LDMOSFET). As LDMOSFET is capable of sustaining high-voltage signals between source and drain, it is appropriately used for power and radio frequency (RF) IC applications. For RF applications, a complete parameter extraction including the parasitic components of the devices used is necessary for accurately predicting the performance of the circuits. In this study, we propose a method to extract the parameters of the small-signal equivalent model containing the field-plate capacitance (C fp ) of a LDMOSFET. The simulated results of this LDMOSFET RF small-signal model agree well with the measured results from 0.5 to 3 GHz. The extracted parameters show that the C fp forms an additional signal path which degrades the effective drain-side resistance and should be considered in RF applications. © 2012 IOP Publishing Ltd.

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