Abstract
Thermal lens microscopy (TLM) is a very sensitive detector for nonluminescent analytes, but its selectivity is poor. However, Takehiko Kitamori, Manabu Tokeshi, Akihide Hibara, and Kiichi Sato at the University of Tokyo and Kanagawa Academy of Science and Technology (Japan) have combined TLM with the separation capabilities of microchips to create a powerful analytical tool.