摘要
We report the development of a tomographic image alignment method, based on the moment of charge density, for three-dimensional (3D) coherent diffraction microscopy. By using a 3D model system, we demonstrate that the moment of charge density improves the alignment accuracy over the conventional cross-correlation method. Better results are also obtained when we apply this method to the alignment of 27 experimental projections from a GaN-Ga2 O3 quantum dot nanoparticle. © 2009 The American Physical Society.