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Total reflection X-ray fluorescence analysis with chemical microchip
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Total reflection X-ray fluorescence analysis with chemical microchip

Kouichi Tsuji, Yousuke Hanaoka, Akihide Hibara, Manabu TokeshiTakehiko Kitamori
Spectrochimica Acta - Part B Atomic Spectroscopy, 卷.61(4), 頁碼.389-392
04/2006

摘要

Chemical microchip Microchannel TXRF Analytical Chemistry Atomic and Molecular Physics and Optics Instrumentation Spectroscopy
A chemical microchip, which has a flat region on the surface, was recently designed for total reflection X-ray fluorescence (TXRF) analysis. A sample solution was introduced from an inlet by a microsyringe and flowed into a microchannel. Finally it overflowed from the well-type microchannel on the flat region. The sample solution on this region was dried, and then measured by TXRF. The TXRF spectra could be measured with a low background level. This preliminary result indicated that the edge of the well-type channel would not cause a serious problem for TXRF analysis. In addition, a good linear relationship was obtained for Zn Kα in Zn standard solution. This suggests that quantitative analysis by TXRF is feasible in combination with a chemical microchip. © 2006.

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