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Unleashing the Power of 2D MoS2: In Situ TEM Study of Its Potential as Diffusion Barriers in Ru Interconnects
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Unleashing the Power of 2D MoS2: In Situ TEM Study of Its Potential as Diffusion Barriers in Ru Interconnects

Ping-Hsuan Feng, Kai-Yuan Hsiao, Dun-Jie Jhan, Yu-Lin Chen, Pei Yuin Keng, 守一 張Ming-Yen Lu
ACS Applied Materials & Interfaces
10/2023

摘要

MoS2;diffusion barrier;in situ TEM;plasma treatment;Ru interconnect

相關連結

指標

1 檢視次數

詳細資料

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