Unsupervised Image Demoiréing with Self-Consistent GAN for TFT-LCD Defect Recognition

期刊文章

Unsupervised Image Demoiréing with Self-Consistent GAN for TFT-LCD Defect Recognition

Jui-Hsin Hsiao, Tsung-Ta Hsieh, Chia-Yen Lee 和宏鍇王

IEEE Transactions on Semiconductor Manufacturing

2025

DOI: https://doi.org/10.1109/TSM.2025.3561919

摘要

GAN;Defect Recognition

相關連結

指標

1 檢視次數

詳細資料

題名: Unsupervised Image Demoiréing with Self-Consistent GAN for TFT-LCD Defect Recognition
創作者：: Jui-Hsin Hsiao (作者)
Tsung-Ta Hsieh (作者)
Chia-Yen Lee (顧問)
宏鍇王 (作者)
學術資源類型: 期刊文章
出版日期: 2025
出版資訊: IEEE Transactions on Semiconductor Manufacturing
語言: 英語