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Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS
Journal article

Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

A.Y. Borisevich, Y.-M. Kim, M.P. Oxley, A. Morozovska, E. Eliseev, Y.H. Chu, P. Yu, S.J. Pennycook and S.V. Kalinin
Microscopy and Microanalysis, Vol.18, pp.318-319
2012

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