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Use of photoelectron microscopes as X-ray detectors for imaging and other applications
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Use of photoelectron microscopes as X-ray detectors for imaging and other applications

Y. Hwu, Y. Hwu, W.L. Tsai, B. Lai, D.C. Mancini, J.H. Je, D.Y. Noh, H.S. Youn, C.S. Hwang, F. Cerrina, …
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 卷.437(2-3), 頁碼.516-520
11/1999
DOI: https://doi.org/10.1016/S0168-9002(99)00757-3

摘要

Nuclear and High Energy Physics Instrumentation
We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantagenously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques.

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