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Versatile Transition-Time Monitoring for Interconnects via Distributed TDC
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Versatile Transition-Time Monitoring for Interconnects via Distributed TDC

Shi-Yu Huang, Chih-Chieh Cheng, Meng-Ting Tsai, Kuan-Chen Huang, Kun-Han Tsai 和 Wu-Tung Cheng
IEEE Design and Test, 卷.33(6), 頁碼.23-30
12/2016
DOI: https://doi.org/10.1109/MDAT.2016.2590979

摘要

boundary scan test interconnects reliability time-to-digital converter timing failure threat Transition-time monitoring Software Hardware and Architecture Electrical and Electronic Engineering
Online monitoring of interconnect delay is important for early detection of reliability hazards, especially in multidie ICs. This article presents a versatile, low-overhead, and nonintrusive monitoring scheme to detect the worst case transition time of interconnects.

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