Visualization and (Semi-)quantification of submicrometer plastics through scanning electron microscopy and time-of-flight secondary ion mass spectrometry.

Journal article

Environmental Pollution, Vol.300, p.118964

2022

Abstract

plastics;electron microscopy

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Title: Visualization and (Semi-)quantification of submicrometer plastics through scanning electron microscopy and time-of-flight secondary ion mass spectrometry.
Creators - without role: 淳宇莊
Identifiers: 9957774958306774
Academic Unit: Institute of Analytical and Environmental Sciences, College of Nuclear Science, National Tsing Hua University
Language: English
Resource Type: Journal article
Publication Details: Environmental Pollution, Vol.300, p.118964