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Zeptogram-scale nanomechanical mass sensing
Journal article   Peer reviewed

Zeptogram-scale nanomechanical mass sensing

Y.T. Yang, C. Callegari, X.L. Feng, K.L. Ekinci and M.L. Roukes
Nano Letters, Vol.6(4), pp.583-586
04/2006

Abstract

Very high frequency (VHF) nanoelectromechanical systems (NEMS) provide unprecedented sensitivity for inertial mass sensing. We demonstrate in situ measurements in real time with mass noise floor ∼20 zg. Our best mass resolution corresponds to ∼7 zg, equivalent to ∼30 xenon atoms or the mass of an individual 4 kDa molecule. Detailed analysis of the ultimate sensitivity of such devices based on these experimental results indicates that NEMS can ultimately provide inertial mass sensing of individual intact, electrically neutral macromolecules with single-Dalton (1 amu) resolution. © Copyright 2006 by the American Chemical Society.

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