Abstract
| In this research project, we present a complete analysis procedure of reliability for electro-explosive devices (EED). In addition to classical dichotomous data analysis with either “Go” or “No Go” data, we expect to use failure time data and degradation measurement to estimate the lifetime distribution of EED. The latter two types of observations are obtained from a new nondestructive testing technology - thermal transient test. In the first stage of the study, a small-scale pilot experiment is conducted to explore some basic information, so a new experimental design - adaptive step-stress experiment, is proposed, which incorporates characters of step-stress designs and adaptive designs. In this article, the adaptive step-stress experiment is introduced and its basic properties are explored. Through statistical analyses of the data collected in the pilot experiment, which includes a Bayesian analysis for zero-failure data, some suggestions are given for the main experiment. |