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Fabrication of oxide-confined collector-up heterojunction bipolar transistors
Letter/Communication   Peer reviewed

Fabrication of oxide-confined collector-up heterojunction bipolar transistors

Wen-Bin Chen, Yan-Kuin Su, Juh-Yuh Su, Meng-Chi Wu, Chun-Liang Lin, Hsin-Chuan Wang, Shi-Ming Chen and Hong-Ren Chen
Japanese Journal of Applied Physics, Part 2: Letters, Vol.42(4 B)
15/04/2003

Abstract

Collector-up HBT Current gain Heterojunction bipolar transistor (HBT) Leakage current Oxide-confined
The first fabrication and current-voltage characteristics of oxide-confined collector-up heterojunction bipolar transistors (HBTs) were reported. A partially oxidized Al 0.98 Ga 0.02 As layer was introduced between the base layer and the emitter layer to reduce the base leakage current. The current gain and the turn-on voltage of the fabricated HBT were 16 and 1.07 V, respectively.

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