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High Electron Mobility Transistor Structure And Method Of Making The Same
Patent

High Electron Mobility Transistor Structure And Method Of Making The Same

Taiwan Semiconductor Manufacturing Company, Ltd., 黃敬源, Yao, Fu-Wei, Hsiung, Chih-Wen, Yu, Jiun-Lei Jerry, Yang, Fu-Chih, Yu, Chen-Ju and Hsu, Chun-Wei
08/08/2019

Abstract

A transistor includes a first layer over a substrate. The transistor also includes a second layer over the first layer. The transistor further includes a carrier channel layer at an interface of the first layer and the second layer. The transistor additionally includes a gate structure, a drain, and a source over the second layer. The transistor also includes a passivation material in the second layer between an edge of the gate structure and an edge of the drain in a top-side view. The carrier channel layer has a smaller surface area than the first layer between the edge of the gate structure and the edge of the drain in the top-side view.

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