Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

National Tsing Hua University; 簡禎富; Chen, Ying-Jen; Chang, Kuo-Hao

Back

Patent

Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

National Tsing Hua University, 簡禎富, Chen, Ying-Jen and Chang, Kuo-Hao

08/04/2015

Abstract

A method for classifying defect images is provided. Defect images are processed through an automatic optical detection. The present invention integrates image analysis and data mining. Defects are found on the images without using human eye. The defects are classified for reducing product defect rate. Thus, the present invention effectively enhances performance on finding and classifying defects with increased consistency, correctness and reliability.

Metrics

1 Record Views

Details

Title: Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining
Translated title: 整合影像分析與資料挖礦之自動光學檢測缺陷影像分類方法
Creators: National Tsing Hua University (Applicant)
簡禎富 (Inventor)
Chen, Ying-Jen (Inventor)
Chang, Kuo-Hao (Inventor)
Note: 優先權TW 102136422 A 20131008
Language: Traditional Chinese
Resource Type: Patent
Patent: US 9,082,009 B2; US 9,082,009 B2
Application code: USA
Application number: 14/154,432
Date application: 13/01/2014
Date published: 08/04/2015
Date issued: 13/07/2015

Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

Abstract

Related links

Metrics

Details

National Tsing Hua University Social media