Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

National Tsing Hua University; 張國浩; Chien, Chen-Fu; Chen, Ying-Jen

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Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

National Tsing Hua University, 張國浩, Chien, Chen-Fu and Chen, Ying-Jen

09/04/2015

Abstract

A method for classifying defect images is provided. Defect images are processed through an automatic optical detection. The present invention integrates image analysis and data mining. Defects are found on the images without using human eye. The defects are classified for reducing product defect rate. Thus, the present invention effectively enhances performance on finding and classifying defects with increased consistency, correctness and reliability.

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Title: Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining
Creators: National Tsing Hua University (Applicant)
張國浩 (Inventor)
Chien, Chen-Fu (Inventor)
Chen, Ying-Jen (Inventor)
Note: 優先權TW 102136422 A 20131008
Language: Traditional Chinese
Resource Type: Patent
Patent: US 9,082,009 B2; US 9,082,009 B2
Application code: USA
Application number: 14/154,432
Date application: 14/01/2014
Date published: 09/04/2015
Date issued: 14/07/2015

Method Of Defect Image Classification Through Integrating Image Analysis And Data Mining

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