Abstract
A phase change memory device is disclosed, including a substrate, a phase change layer over the substrate, a first electrode electrically connecting a first side of the phase change layer, a second electrode electrically connecting a second side of the phase change layer, wherein the phase change layer composes mainly of gallium (Ga), antimony (Sb) and tellurium (Te) and unavoidable impurities, having the composition range of Ga.sub.xTe.sub.ySb.sub.z, 5<x<40; 8.ltoreq.y<48; 42<z<80; and x+y+z=100.