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Process Quality Predicting System And Method Thereof
Patent

Process Quality Predicting System And Method Thereof

Pan, Tain-Hong, Jang, Shi-Shang, Wong, Shan-Hill, 鄭西顯, 汪上曉 and 潘天紅
17/11/2011

Abstract

The invention discloses a process quality prediction system and a method thereof. When a processing apparatus performs a process on a target, the process is measured by a measurement apparatus to receive a process value. The process value and several previous quality data collected from the measurement apparatus are used to predict the quality of the product which is processing inline. The method is composed of a moving window, a stepwise regression scheme and an analysis of covariance (ANCOVA). The drift and shift of process are overcome by the moving window. A key variable set is selected by the stepwise regression scheme and a virtual model is identified by the analysis of covariance.

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