Abstract
An integrated circuit for on-chip speed grading comprises test circuitry comprising scan chains and a test controller; and wide-range clock signal generation circuitry comprising phase-locked loop circuitry and frequency divider circuitry. The wide-range clock signal generation circuitry is configured to generate a wide-range test clock signal for the test circuitry to conduct a structural delay test for on-chip speed grading. The wide-range test clock signal is generated based on a test clock signal associated with the test circuitry, a frequency range selection signal and a frequency setting signal.