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一種可用於電子顯微鏡樣品裝置結構及其製作方法
Patent

一種可用於電子顯微鏡樣品裝置結構及其製作方法

國立清華大學, 游萃蓉 and 劉國良
16/06/2008

Abstract

Conventional electron microscope is presently not allowed to observe liquid or volatile specimens due to its operation in high-vacuum environment, which limits its applications. This is because the specimen kit can't seal the liquid or volatile samples to prevent its contamination to vacuum environment. This invention is about a new specimen kit which can seal the sample to prevent its contamination to vacuum chamber so it can be applied to electron microscopy. This new specimen kit exhibits many potential applications, such as enabling observation of living biology or volatile sample in electron microscope.

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