Logo image
三維晶片之突波型態層識別編號檢測器及其方法
Patent

三維晶片之突波型態層識別編號檢測器及其方法

國立清華大學, 陳銘斌, 張孟凡 and 吳威震
01/01/2012

Abstract

A 3D-IC detector for each layer of a stacked device comprises a pulse generator to receive an initial signal and generate a pulse-in signal to a next stage detector. A latch is coupled to the pulse generator to receive an output signal from the pulse generator and generate a layer identifying signal. A counter is coupled to previous stage detector and the initial signal to perform a counting operation; and an adder coupled to the counter to add a number to a counting output from the counter and input added signal to the pulse generator.

Metrics

1 Record Views

Details

Logo image