Abstract
The invention relates to detector for discontinuous type layer identification numbers of three-dimensional (3D) chips and a method thereof. The detector is a detector which is used for a 3D chip of each layer of an N-layer stacked component. The detector comprises a 2-divided circuit, a first comparator, a second comparator, a first add/sub circuit and a second add/sub circuit, wherein the 2-divided circuit is coupled to a (N-1) signal; the first comparator is coupled to the 2-divided circuit, an input A of the first comparator is coupled to an initial layer number signal, and an input B of the first comparator is coupled to an output of the 2-divided circuit; the second comparator is coupled to the initial number of layers through an input A of the second comparator, and a num is coupled to an input B of the second comparator; the first add/sub circuit is coupled to the num through an input A of the first add/sub circuit, is coupled to the first comparator through an input B of the first add/sub circuit and is coupled to the second comparator through an input '+/-' signal of the first add/sub circuit; and the second add/sub circuit is coupled to the first comparator through an input A of the second add/sub circuit and is coupled to the num through an input B of the second add/sub circuit.