Abstract
A pixel array module with a self-test including a testing circuit unit, a plurality of testing lines, and a pixel array is provided. The testing circuit unit provides the self-test function. The testing lines are connected between the testing circuit unit and the pixel array. The pixel array is connected to the testing circuit unit through the testing lines and includes a plurality of pixels. Each pixel includes a transistor. Each transistor has a first terminate and a second terminate. For each pixel, a driving signal of the transistor is transmitted from the first terminate to the second terminate thereof under a normal mode, and a testing signal of the transistor is transmitted from the second terminate to the first terminate thereof under a test mode. Furthermore, a self-test methodology of the foregoing pixel array module is also provided.