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具有薄層層析之拉曼檢測晶片及分離檢測分析物之方法
Patent

具有薄層層析之拉曼檢測晶片及分離檢測分析物之方法

大任 嚴, 黃致豪, 大任 嚴, 李璧伸 and 林鼎晸
03/07/2018

Abstract

A Raman detecting chip for thin layer chromatography and a method for separating and detecting an analyte are provided. The Raman detecting chip for thin layer chromatography includes a silicon substrate. The silicon substrate includes a flat portion and a plurality of silicon nanowires disposed on the flat portion, wherein each silicon nanowire has a top surface and a sidewall. A metal layer covers the top surface and at least a part of the sidewall. The silicon nanowire has a length from 5 μm to 15 μm.

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