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微機械結構之檢測方法及微檢測結構
Patent

微機械結構之檢測方法及微檢測結構

台達電子工業股份有限公司, 蔡欣昌 and 方維倫
15/02/2005

Abstract

A test method of a micro mechanical structure and a micro test structure are provided for getting mechanical properties of a film of the micro mechanical structure. First, a micro test structure is formed on a substrate of the micro mechanical structure and a test part of the micro test structure is made of the film. The test part is vibrated and the resonance frequency of the test part is measured. By geometry dimension, density, and resonance frequency of the test part, the mechanical properties of the test part can be calculated. Then the mechanical properties of the film can be obtained. Besides, the types of the micro test structure include "micro cantilever beam" and "free-free beam".

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