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整合影像分析與資料挖礦之自動光學檢測缺陷影像分類方法
Patent

整合影像分析與資料挖礦之自動光學檢測缺陷影像分類方法

國立清華大學, 陳暎仁, 簡禎富 and 張國浩
15/04/2015

Abstract

A method for optically detecting defectsis provided. The present invention integrates image analysis and data mining. Defects are found on image without human eye. The defects are graded for reducing product defect rate. Thus, the present invention effectively enhances performance on finding and grading defects on images with increased consistency, correctness and reliability.

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