Overview of memory testing technology

Technical documentation

Overview of memory testing technology

C.-T. Huang and C.-W. Wu

IC Design Magazine (in Chinese), Vol.9, pp.72-76

12/2000

Abstract

memory testing

Electronic Engineering

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Title: Overview of memory testing technology
Creators - without role: C.-T. Huang
C.-W. Wu
Publication Details: IC Design Magazine (in Chinese), Vol.9, pp.72-76
Identifiers: 9957772258506774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Technical documentation