VLSI Test Technology Forum

Technical documentation

VLSI Test Technology Forum

C.-W. Wu and C.-T. Huang

IC Design Magazine (in Chinese), Vol.12, pp.86-88

03/2001

Abstract

VLSI test technology

semiconductor;electronic engineering

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Title: VLSI Test Technology Forum
Creators - without role: C.-W. Wu
C.-T. Huang
Publication Details: IC Design Magazine (in Chinese), Vol.12, pp.86-88
Identifiers: 9957766456806774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Technical documentation