Logo image
Robustness testing of PLS, LISREL, EQS and ANN-based SEM for measuring customer satisfaction
期刊文章   同儕審查

Robustness testing of PLS, LISREL, EQS and ANN-based SEM for measuring customer satisfaction

Sheng-Hsun Hsu, Wun-hwa Chen 和 Ming-jyh Hsieh
Total quality management & business excellence, 卷.17(3), 頁碼.355-372
01/04/2006
Web of Science ID: WOS:000236578500005

摘要

ANN EQS LISREL PLS robustness
Researchers have shown the Customer Satisfaction Index (CSI) can serve as a predictor for companies' profitability and market value. To measure a CSI model, we have to use a Structure Equation Model (SEM) technique. There are two types of SEM techniques - covariance-based (e.g. LISREL, EQS or AMOS) and component-based SEM techniques (e.g. Partial Least Square). With the growing importance of a CSI model, we must determine which SEM technique can better measure a CSI model. In addition, with the increasing complexity of a theoretical model (e.g. non-linear relations between variables), researchers have called for new SEM techniques that could address this issue. Hackle & Westlund (2000) contended that the Artificial Neural Network (ANN)-based SEM technique could be superior to traditional SEM techniques because it can measure non-linear relations by using different activity functions and layers of hidden nodes. Thus, this study extends previous research in several directions. First, we conduct the robustness testing of both covariance-based (LISREL and EQS) and component-based (PLS) SEM techniques, not only on a simulated CSI-like model but also on a real-life CSI model. Second, we explore the feasibility of an ANN-based SEM technique.

相關連結

詳細資料

Logo image